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NIST Selects JEOL Microscope for Federal Facility

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PEABODY, Mass., Sept. 22, 2010 — The National Institute of Standards and Technology (NIST) placed an order for JEOL’s atomic resolution analytical JEM-ARM200F transmission electron microscope (TEM) through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured instrument in the NIST Precision Measurement Laboratory in Boulder, Colo. “We are very excited to be partnering with this premier federal government facility and are confident the opportunity will recognize the high performance capability of this new TEM platform,” said Peter...Read full article

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    Published: September 2010
    Glossary
    optical
    Pertaining to optics and the phenomena of light.
    transmission electron microscope
    A transmission electron microscope (TEM) is a powerful microscopy technique that uses a beam of electrons to create high-resolution images of extremely thin samples. In a TEM, electrons are transmitted through the sample rather than being bounced off its surface, as in scanning electron microscopy (SEM). The sample, typically prepared as an ultrathin section or a thin film, is placed in the path of the electron beam. As the electrons pass through the sample, they interact with its atoms,...
    aberrationaberration correctionAmerican Recovery and Reinvestment actAmericasanalytical instrumentARM200Fatomic resolutionBasic ScienceBusinesselectron microscopeselectron optical equipmentfederal government facilityindustrialJEM-ARM200FJEOLJEOL USAMicroscopyNational Institute of Standards and TechnologyNISTopticalOpticsPeter GenovesePrecision Measuremnet LaboratoryS/TEMsemiconductorsTEMTEM platformtransmission electron microscope

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