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Test & Measurement
News & Features
Aug 23, 2024
Lens-Free Fluorometer Can Monitor Water Quality in Low-Resource Settings
Jul 12, 2024
Spectris Acquires SciAps
Jul 12, 2024
Topological Platform Can Increase Frequency Comb Efficiency
Jul 9, 2024
Low-Power Lasers Exhibit Narrow Linewidth Needed for Quantum Computing
Jun 27, 2024
Quantifi Photonics Appoints Co-Founder as CEO
Products
Automated Cell Counter
DeNovix Inc.
3D Snapshot Measurement Sensor
Micro-Epsilon UK & Ireland Ltd.
Zone Triggering Oscilloscopes
Rohde & Schwarz GmbH & Co. KG
Digital Fluorescence Microscope
Leica Microsystems GmbH
Miniature Linear Voice Coil Motors
Moticont
Handbook Articles
Scatter and BSDF Measurements: Theory and Practice
Measuring Aspheres: Selecting the Best Technique
Measuring Surface Roughness: The Benefits of Laser Confocal Microscopy
Measuring Small-Beam MFD: Overcoming the Challenges
Laser Measurement Systems: Best Practices
White Papers
Monolithic Hollow Corner Cube Retroreflectors for Precision Metrology
Addressing XR Device Optical Measurement Challenges
Coherent Optical Comb Characterization
Emerging Challenges in Smart Glass Quality
Measuring Near-Infrared (NIR) Light Sources for Effective 3D Facial Recognition
Webinars
Measuring Starlight with an Ultrafast Laser: Astrocomb Development for the Extremely Large Telescope
Quantitative Evaluation Method for Depth Accuracy and Precision Metrics in Depth Cameras
Serial Communication for Quick Integration of Automated Laser Output Measurements
Solid-State Light Sources: Understanding the Performance of VCSELS, Laser Diodes, and LEDs
Ensuring Stable Processing with High-Power Continuous Wave Lasers through Targeted Beam Analysis
Companies
Zygo Corporation
Heidenhain Corporation
Apre Instruments
Yelo Limited
DataRay Inc.
Buyers' Guide Categories
7 companies
Ionization Gauges
5 companies
Microspectrophotometers
40 companies
Spectroscopic Accessories and Supplies
4 companies
Optical Surveying Instruments
9 companies
Optical Height Gauges
Videos
Heidenhain TNC7: Enter a New Level
Celebrating 10 Years of Äpre
4Di InSpec Automated Metrology System (AMS) - 4D Technology Corporation
Getting to Know Helium-3 Detectors - Berkeley Nucleonics Corporation
Ramacle® Software Highlight: Fast Mapping - Edinburgh Instruments
August 2024
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