Definition of transmission electron microscope

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transmission electron microscope: A transmission electron microscope (TEM) is a powerful microscopy technique that uses a beam of electrons to create high-resolution images of extremely thin samples. In a TEM, electrons are transmitted through the sample rather than being bounced off its surface, as in scanning electron microscopy (SEM). The sample, typically prepared as an ultrathin section or a thin film, is placed in the path of the electron beam. As the electrons pass through the sample, they interact with its atoms, producing signals that can be used to generate detailed images with nanometer-scale resolution.

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TEMs are capable of revealing the internal structure, morphology, crystallographic information, and elemental composition of materials at the atomic level. They are widely used in various fields of science and technology, including materials science, nanotechnology, biology, and medicine, for studying the structure and properties of materials and biological specimens.

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