About This Webinar
3D optical methods have come a long way from the early stereo viewers and multiangle sliding images that existed more than a century ago. As measurement tools, these methods have in the past 40 years progressed from crude 2D profilers to fast 3D real-time scanners. Today, many options are available to meet a wide range of needs, from checking bridges to verifying car parts to observing nanostructures used in medicine.
Kevin Harding of Optical Metrology Solutions provides an overview of the many 3D optical metrology tools available today. He discusses applications from general manufacturing of durable parts to precision component measurement. He shares examples, typical performance specifications, and the limitations of the many tools on the market today. Harding then considers each technology for both the type of application it is best suited to address, as well as its speed and resolution. Finally, he shows where each technology fits within the bigger picture of practical applications.
Who should attend:
R&D scientists, engineers, manufacturers, and designers who are interested in or who use 3D optical metrology. Those who work in machine vision, aerospace, automotive, communications, energy, medicine, nanotechnology, ophthalmology, and semiconductors, using technologies such as coatings, sensors, displays, imaging, microscopy, nanophotonics, test and measurement, quality control, systems integration, and robotics.
About the presenter:
Kevin Harding has over 40 years of experience in optical instrumentation, machine vision, and optical metrology. At GE Research, he led the activity in optical metrology, doing work for the many businesses of GE. In 2017, Harding retired from GE as a principal scientist to start the company Optical Metrology Solutions LLC. Before GE, he was the director of the Electro-Optics Lab at the Industrial Technology Institute, where he conducted over 200 projects and spun off six commercial products. Harding chaired many technical conferences on machine vision and metrology. He is internationally recognized for his expertise in 3D measurement technology and has been recognized by many organizations, including SME, AIA, SPIE, and ESD (Empire State Development).
Harding has published over 150 technical papers, taught over 80 short courses, and received over 85 U.S. patents. He is the primary author and editor of the CRC Handbook on Optical Dimensional Metrology and author of Practical Optical Dimensional Metrology from SPIE Press. He has served as an association and conference chair for over 35 years, working with SPIE, LIA, ESD, SME, and Optica. Harding is a fellow and past president of SPIE.