The "Semiconductor Device Test Applications Guide," a free CD available from Keithley, includes semiconductor test application information on topics including two-terminal device, bipolar transistor, FET, substrate bias and high-power tests. The CD features more than a dozen application notes about, for example, on-the-fly Vth measurements for bias temperature instability characterization, increasing production throughput of multipin devices, optimizing switched measurements; white papers on test sequencing instruments and the fundamentals of the LXI communication protocol; six presentations; and test scripts. For more information, visit: www.ggcomm.com/Keithley/May08PR_SemiAppsGuide.html