Polarization Imaging
Hinds Instruments Inc.Request Info
SPIE Photonics West 2018 Booth: 1613
Increase your speed and enjoy quantified data while examining collagen samples, imaging myelin, viewing microscopic defects in diamond and analyzing stress in glass, film, polymers and liquid crystal. Using the Exicor MicroImager measures retardance from 0 to 315nm in a matter of seconds with a spatial resolution of up to 0.7µm. Phase Unwrapping technology and our advanced 4 wavelength system allows retardance measurements up to 3500nm for highly birefringence samples.
https://www.hindsinstruments.com/products/exicor-micro-imager/
/Buyers_Guide/Hinds_Instruments_Inc/c6111
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