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Microscopy
Microscope Systems
Other Microscopy Products
Key Suppliers
Prior Scientific Inc.
Thorlabs Inc.
Siskiyou Corporation
Andor Technology
Bruker Nano Surfaces
Applied Scientific Instrumentation Inc.
Edmund Optics
CoolLED Ltd.
Zygo Corporation
Photon etc.
DRS Daylight Solutions Inc.
Apre Instruments
Sutter Instrument Company
16 products
Microscopy
Clear All Filters x
scans x
Microscopy x
Robotic Sample Handling Systems
Prior Scientific Inc.
Category:
Microscopy / Other Microscopy Products
Type:
Other
Single-Objective Light Sheet
Applied Scientific Instrumentation Inc.
Category:
Microscopy / Microscope Systems
Type:
Optical
Magnification:
67X
Spectral Range:
VIS
Field of view:
≤350µm
Measured resolution in X:
≅450nm
Measured resolution in Y:
≅350nm
MultiMode 8-HR
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Imaging Noise Level:
<30 pm rms
Maximum Sample Size:
15 mm dia × 5 mm thick
JPK NanoWizard AFMs
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Innova
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Closed-Loop, Large-Area Scanner:
XY >90 µm, Z >7.5 µm
Open-Loop, Small-Area Scanner:
XY >5 µm, Z >1.5 µm
Sample Size:
45 mm × 45 mm x 18 mm
Dimension FastScan Bio
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Sample Environment — Flow Cell:
60 μL
X-Y Tip-Velocity Max.:
>2 mm/s
Z Range:
≥3 μm
Dimension FastScan
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Integral Nonlinearity XYZ:
<0.50%
X-Y Scan Range:
90 μm × 90 μm typical
Z Range:
10 μm typical in imaging
Dimension Edge
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
X-Y Scan Range:
85 μm minimum
Z Range:
9.5 μm minimum
Ultima Multiphoton
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Scan Size:
64 x 64 to 2048 x 2048
Scanning Method:
Pair of 6mm galvanometers
Dimension Icon
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Integral nonlinearity XYZ:
<0.5% typical
X-Y scan range:
90 μm x 90 μm typical
Z range:
10 μm typical in imaging
Tungsten Filament Scanning Electron Microscope SEM3200
CIQTEK Co. Ltd.
Category:
Microscopy / Microscope Systems
Type:
Electron
Acceleration Voltage:
0.2-30 kV
Extension:
SE\BSE\EDS\EDX\EBSD, etc.
Low Vacuum Mode:
3 nm @ 30 kV (SE)
FESEM Field Emission Scanning Electron Microscope SEM5000Pro
CIQTEK Co. Ltd.
Category:
Microscopy / Microscope Systems
Type:
Electron
Acceleration Voltage:
0.02 ~ 30 kV
Electron Gun:
High-brightness Schottky
Magnification:
1 ~ 2,500,000 ×
TopMap Micro.View 3D Optical Profiler
Polytec Inc.
Category:
Microscopy / Other Microscopy Products
Type:
Other
NanoScan OP400
Prior Scientific Instruments Ltd.
Category:
Microscopy / Other Microscopy Products
Type:
Other
Travel Range - closed loop:
400µ
Travel Range - open loop:
480µ
MicroTime 200
PicoQuant GmbH
Category:
Microscopy / Microscope Systems
Type:
Optical
Magnification:
100X
Spectral Range:
UV,VIS
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Microscopy Products
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