TopMap Micro.View is an easy to use compact optical profiler, combining performance and affordability. Continuous Scanning Technology (CST) allows complex topographies to be measured at nm resolution for the entirety of the 100 mm scan range. This table-top setup features integrated electronics, an encoded turret and smart focus finder technology to simplify and speed up the measurement procedure.
16400 Bake Pkwy.
Irvine, CA 92618
United States
Phone: +1 949-943-3033