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Excelitas PCO GmbH - PCO.Edge 11-24 BIO LB

Veeco Buys IBM's Atomic Force Microscope Assets

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PLAINVIEW, N.Y., Mar. 29 -- Veeco Instruments Inc. has purchased certain assets related to the Delray Beach, Fla.-based atomic force microscope (AFM) product line of International Business Machines Corp. (IBM). Don Kania, vice president and general manager of Veeco Metrology Group's Santa Barbara operations, will oversee the integration of this technology into Veeco's atomic force metrology products.
Kania stated, Our goal is to continue to be the world's leading supplier of AFM measurement equipment. In particular, the IBM purchase will allow us to expand the capabilities of our current semiconductor fab tool set for 200- and 300-mm wafers, including the Dimension 9000 and Vx Series tools for etch metrology and chemical mechanical polishing (CMP). Veeco has confirmed that it plans to provide continued support for the installed base of IBM products on a worldwide basis.
Opto Diode Corp. - Detector Spotlight 10-24 MR

Published: March 2000
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metrology
Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
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