Search
Menu
Opto Diode Corp. - Opto Diode 10-24 LB

RVSI Wins Taiwan Order for Wafer Inspection System

Facebook X LinkedIn Email
CANTON, Mass., June 11 -- Robotic Vision Systems Inc. has received an order for a WS-2510 bumped wafer inspection system from a Taiwan producer of wafer-level packaging solutions. The system will be used for 2-D surface defect inspection as well as for 3-D metrology on gold and solder bumps and will be installed at the company's new bumping facility in Hsin-Chu Hsien, Taiwan. "This order had special significance to us because the customer required a single inspection tool that was sufficiently versatile to cover an extremely broad range of inspection applications encompassing 3-D metrology...Read full article

Related content from Photonics Media



    Articles


    Products


    Photonics Handbook Articles


    White Papers


    Webinars


    Photonics Dictionary Terms


    Media


    Photonics Buyers' Guide Categories


    Companies
    Published: June 2002
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    metrologyNews & Features

    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.