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Opto Diode Corp. - Opto Diode 10-24 LB

RVSI Wins Taiwan Order for Wafer Inspection System

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CANTON, Mass., June 11 -- Robotic Vision Systems Inc. has received an order for a WS-2510 bumped wafer inspection system from a Taiwan producer of wafer-level packaging solutions. The system will be used for 2-D surface defect inspection as well as for 3-D metrology on gold and solder bumps and will be installed at the company's new bumping facility in Hsin-Chu Hsien, Taiwan.

"This order had special significance to us because the customer required a single inspection tool that was sufficiently versatile to cover an extremely broad range of inspection applications encompassing 3-D metrology and 2-D surface inspection on both gold and older bumps," said Michael Gray, the Semiconductor Equipment Group's vice president of sales.

AdTech Ceramics - Ceramic Packages 1-24 MR

Published: June 2002
Glossary
metrology
Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
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