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Hitachi Electron Microscopy Products Centre Opens

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EDMONTON, Alberta, Canada, July 21, 2011 — The official opening of the Hitachi Electron Microscopy Products Centre (HEMiC) is providing access to a uniquely configured transmission electron microscope, the first of its kind outside of Japan. Installed at the National Institute for Nanotechnology (NINT) at the University of Alberta, the instrument is one of three new microscopes at the center. “Innovation is the key to growing our economy, and this project will allow businesses to capitalize on the benefits of nanotechnology,” said Lynne Yelich, minister of state for Western Economic Diversification. “That...Read full article

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    Published: July 2011
    Glossary
    nanotechnology
    The use of atoms, molecules and molecular-scale structures to enhance existing technology and develop new materials and devices. The goal of this technology is to manipulate atomic and molecular particles to create devices that are thousands of times smaller and faster than those of the current microtechnologies.
    scanning electron microscope
    A scanning electron microscope (SEM) is a powerful imaging instrument used in scientific research, materials characterization, and various industrial applications. Unlike traditional optical microscopes, which use visible light to magnify and image specimens, SEMs use a focused beam of electrons to generate high-resolution images of a sample's surface. scanning electron microscope suppliers → The basic principle of operation involves focusing a beam of electrons onto the...
    transmission electron microscope
    A transmission electron microscope (TEM) is a powerful microscopy technique that uses a beam of electrons to create high-resolution images of extremely thin samples. In a TEM, electrons are transmitted through the sample rather than being bounced off its surface, as in scanning electron microscopy (SEM). The sample, typically prepared as an ultrathin section or a thin film, is placed in the path of the electron beam. As the electrons pass through the sample, they interact with its atoms,...
    AlbertaAmericasBasic ScienceBusinessCanadaenvironmental transmission electron microscopefocused ion beamGreg WeadickH-9500HEMiCHitachi Electron Microscopy Products CentreHitachi High TechnologiesImagingLynne YelichMicroscopynanotechnologyNational Institute for NanotechnologyNB5000NINTResearch & TechnologyS-5500scanning electron microscopeSEMtransmission electron microscopeUniversity of Alberta

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