DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

view all white papers and application notes

Measurement of Film Stacks in Cell Phones and Tablets Using White Light Interferometry

Author: Filipp Ignatovich, Michael Spaeth, John Solpietro, Winslow Cotton, Donald Gibson
Monday, July 20, 2015
Lumetrics

With the explosive growth of the tablet and smart phone market, equipment suppliers are developing more complex structures that include polarizers, LCDs, structured air gaps, and more. There are few systems that provide the measurement capabilities to examine all the layers, non-destructively. Lumetrics will provide examples of how its white light interferometer has easily provided these measurements. Lumetrics will provide results of testing on various samples of up to 10 – 20 layers.

Download

Download White Paper

File: AIMCAL_Paper.pdf (786.99 KB)
To download this white paper, please complete the *required fields before clicking the "Download" button.

Your contact information

* First Name:

* Last Name:

* Email Address:

* Company:

* Country:

When you click "Download", you agree that your personal contact information may be shared with Lumetrics and they may contact you about their products and services in the future. You also agree that Photonics Media may contact you with information related to this request, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

* Required

Similar White Papers and Application Notes

Full-Field Hotspot Detection and High-Resolution Topographic Characterization of Post-CMP Wafers with 3D Optical Profiling

Traditional methods of post-CMP process evaluation have analytical limitations that, in light of tightening process control limits, do not meet the growing need for more accurate wafer surface...

8/1/2021

- Bruker Nano Surfaces

Integrating Sphere Fundamentals and Applications

An integrating sphere collects electromagnetic radiation from a source completely external to the optical device, usually for the purpose of flux measurement or optical attenuation. Newport’s general...

5/31/2016

- MKS/Newport

Thickness Measurements of Opaque and Transparent Films or Coatings with WLI

Accurate control over film thickness and uniformity is essential for throughput and performance in the automotive, aerospace, semiconductor, medical, and research industries. The modern standard for...

9/16/2024

- Bruker Nano Surfaces

Test & MeasurementSensors & Detectorsfilm measurementLCD Measurementinterferometerswhite light interferometrynon-contact measurementnon-destructive measurementcell phone measurementthin glass measurementcoating measurementfilm quality controlglass quality controloptical measurementLumetrics

November 2024 Subscribe Advertise
Issue Library

Opto Diode Corp. - Detector Spotlight 10-24 MR

Meadowlark Optics - Wave Plates 6/24 MR 2024