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High-Resolution Chemical Imaging with Tapping AFM-IR

Author: Anirban Roy, PhD (Bruker nanoIR Applications Scientist) and Dean Dawson (Bruker nanoIR Spectroscopy Business Manager)
Monday, April 1, 2019
Bruker Nano Surfaces

Where the spatial resolution of conventional bulk IR spectroscopy is limited by diffraction to ~3-10 µm, atomic force microscopy (AFM) provides a nanoscale topographic map of a sample surface. However, AFM has been unable traditionally to chemically characterize materials. This article discusses Tapping AFM-IR, which is a photothermal technique that combines AFM and IR spectroscopy to unambiguously identify the chemical composition of a sample with tens-of-nanometers spatial resolution.

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