PFG Precision Optics - Precision Optics 12/24 LB

view all white papers and application notes

Asphere Metrology: Options for Measuring Aspheric Lenses

Tuesday, January 19, 2010
Optimax Systems Inc.

This paper will outline the numerous metrology options for aspheres at Optimax, including how they work, any requirements, and what is specified with each method in an effort to help reasonably tolerance aspheres. Effects on the fabrication and cost of the lens will also be discussed. Metrology of aspheres fits into three basic categories: physically measuring the form of the optical surface, reflected wavefront testing, and transmitted wavefront testing. Each category has different methods of testing with varying degrees of accuracy.

Download

Download White Paper

File: Asphere_Metrology__Options_for_Measuring_Aspheric_Lenses.pdf (466.94 KB)
To download this white paper, please complete the *required fields before clicking the "Download" button.

Your contact information

* First Name:

* Last Name:

* Email Address:

* Company:

* Country:

When you click "Download", you agree that your personal contact information may be shared with Optimax Systems Inc. and they may contact you about their products and services in the future. You also agree that Photonics Media may contact you with information related to this request, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

* Required

Similar White Papers and Application Notes

Metrology for the Manufacture of Freeform Optics

Freeform optics are gaining popularity with lens designers and optical system integrators as a method to solve complex optical system design problems. Optimax has developed new freeform manufacturing...

8/1/2018

- Optimax Systems Inc.

3 Questions to Ask Before Buying Infrared Interferometry

Important considerations in obtaining infrared optical metrology, for measuring transmitted wavefront error, optical quality, and surface quality. The paper asks questions to help guide the reader in...

6/1/2022

- 4D Technology Corp.

Easy to use Computer Generated Holograms for Complex Surface Metrology

There are many metrology methods on the market for testing aspheres. The method with one of the highest known accuracies is based on a Fizeau interferometer, in combination with a CGH. We describe a...

6/1/2021

- DIOPTIC GmbH

aspheresFARO Gage Plusinterferometerslensesmetrologynull testingoptical designOpticsOptimaxprofilometrysubaperture stitching interferometerTalysurfTaylor HobsonTest & Measurementtransmitted wavefront errorTWEVerifire asphere interferometerwavefront testingZygo

December 2024 Subscribe Advertise
Issue Library

PowerPhotonic Ltd. - Bessel Beam Generator MR 6/24

Optimax Systems, Inc. - Ultrafast Coatings 2024 HP