SXFiveFE FE-EPMA
GENNEVILLIERS, France, May 27, 2011 — For quantitative microanalysis and x-ray imaging at high spatial resolution, Cameca, a unit of Ametek’s Materials Analysis Div., has unveiled the SXFiveFE, a field emission electron probe microanalyzer (FE-EPMA).
Developed for a wide range of micro- and nanoanalytical applications, it combines proven proprietary technology with the latest developments in general-purpose electron probe microanalyzers, including the addition of a field emission source. It features a field emission...
Cameca SAS