Register
Sign In
Subscribe
Advertise
Publications
Photonics Spectra
BioPhotonics
Vision Spectra
Photonics Showcase
Photonics Buyers' Guide
Photonics Handbook
Photonics Dictionary
Newsletters
News & Features
Latest News
Latest Products
Features
All Things Photonics Podcast
By Technology
Lasers & Light Sources
Optics
Materials & Coatings
Imaging
Sensors & Detectors
Test & Measurement
Integrated Photonics
Spectroscopy
Biophotonics
Machine Vision
Marketplace
Supplier Search
Product Search
Career Center
Webinars & Events
Webinars
Photonics Media Virtual Events
Industry Events Calendar
Resources
White Papers
Videos
Bookstore
Contribute an Article
Suggest a Webinar
Submit a Press Release
Subscribe
Advertise
Become a Member
Publications
Photonics Spectra
BioPhotonics
Vision Spectra
Photonics Showcase
Photonics Buyers' Guide
Photonics Handbook
Photonics Dictionary
Newsletters
News & Features
Latest News
Latest Products
Features
All Things Photonics Podcast
By Technology
Lasers & Light Sources
Optics
Materials & Coatings
Imaging
Sensors & Detectors
Test & Measurement
Integrated Photonics
Spectroscopy
Biophotonics
Machine Vision
Marketplace
Supplier Search
Product Search
Career Center
Webinars & Events
Webinars
Photonics Media Virtual Events
Industry Events Calendar
Resources
White Papers
Videos
Bookstore
Contribute an Article
Suggest a Webinar
Submit a Press Release
Subscribe
Advertise
Become a Member
Register
Sign In
submit product
Test & Measurement Products
PMD ANALYZER
Sep 1, 2000 — Exfo Electro-Optical Engineering Inc. has released a polarization mode dispersion (PMD) analyzer to support high-speed fiber transmission rates. The FTB-5500 analyzer has a measurement range of 0.05 to 200 ps, and its field-oriented interferometric technology characterizes the PMD of optical links with a dynamic range of more than 50 dB. The system's software tests optical fiber with high or weak mode coupling, features multiple measurement and autonaming file storage functions, and includes a...
EXFO Inc.
Request info >
SOURCE BANK
Sep 1, 2000 — ILX Lightwave Corp. has added a high-density source bank to its line of photonic test and measurement instrumentation. The SSB-9200 is designed for WDM component, amplifier and system testing, accommodating up to 48 distributed feedback (DFB) laser...
Newport - ILX Lightwave, Photonics
Request info >
WAVELENGTH METER
Sep 1, 2000 — The Q8326 optical wavelength meter from Tektronix Inc. tests laser diodes for use in telecommunications. It has a wavelength accuracy of ±2 ppm and resolution to 0.1 pm. The meter has a sampling rate of five measurements per second and a...
Tektronix Inc.
Request info >
FIBER SWITCHES
Aug 1, 2000 — Fiber optic switches are available from piezosystem jena GmbH for optical measurement, transmission technology and spectroscopy applications. The F-SM19 has one input channel and can be switched to nine channels of output. The F-SM16 has one to six...
piezosystem jena GmbH
Request info >
LASER POWER METER
Aug 1, 2000 — Ophir Optronics Inc. has introduced a meter for measuring the power of static and scanned laser beams with up to 20 mW of average power. The BC20 scans up to 30,000 in./s with NIST-traceable accuracy to -5%. The standard model is calibrated for...
MKS Ophir, Light & Measurement
Request info >
MEASURING DISPLACEMENT
Aug 1, 2000 — The LaserMax DMI 500 is a displacement measuring interferometer for machine tool control and calibration, integrated circuit wafer processing and micropositioning. LaserMax Inc.'s device is capable of 0.083-µm resolution with a range of 500...
LMD Power of Light Corp. dba LaserMaxDefense
Request info >
PICOSECOND DIODE LASER
Aug 1, 2000 — The PDL 800 is suitable for time-resolved fluorescence spectroscopy, fiber-based distributed temperature measurement, wafer inspection systems, time-response characterization of optoelectronic devices and optical tomography of biological tissue....
PicoQuant GmbH
Request info >
POLARIZATION EXTINCTION RATIOMETER
Aug 1, 2000 — Santec Europe Ltd. offers a device for measuring polarization extinction ratio, optical power and polarization angle in real time. The PEM-310 simultaneously displays the measurements on the front panel and can output the results via a...
Santec Corp.
Request info >
PROCESS PHOTOMETER
Jul 1, 2000 — Providing rapid sequential measurements with up to eight probes, the ChemViewMx allows measurements in the UV, VIS and NIR with one analyzer. One probe from the fiber optic-based process photometer measures aromatic stripping at 254 nm, a second...
Synopsys Inc., Optical Solutions Group
Request info >
SIGNAL ANALYZER
Jul 1, 2000 — Anritsu Co.'s portable analyzer can measure SONET, SDH, PDH and ATM for use during the R&D and manufacture of optical circuits, as well as during the installation and maintenance of fiber networks. The MP1570A modular analyzer can measure signal...
Anritsu Co.
Request info >
SPECTROPHOTOMETER
Jul 1, 2000 — PerkinElmer Instruments has introduced a UV/VIS spectrophotometer with a low-noise photomultiplier and a demountable sample compartment. The Lambda 800 double-beam, double-monochromator system has a range from 175 to 900 nm and performs...
Revvity
EDFA/DWDM TEST AND MEASUREMENT INSTRUMENT
Jun 1, 2000 — ILX Lightwave Corp. offers the FTS-9200 high-density comb source for the test and measurement of erbium-doped fiber amplifiers and dense wavelength division multiplexers. It features up to 48 distributed feedback source modules in one instrument...
Newport - ILX Lightwave, Photonics
Request info >
PHOTON COUNTER
Jun 1, 2000 — Two digital photon counting systems from C&L Instruments connect to transistor-transistor-logic-output photomultiplier tube modules for performing low-light intensity measurements. The systems include a plug-and-play ISA PC card and software,...
C & L Instruments Inc.
Request info >
UV DOSE MEASUREMENT
Jun 1, 2000 — The Con-Trol-Cure Rad Check system from UV Process Supply Inc. can measure UV energy doses from curing systems that are inaccessible to conventional radiometers. Designed for web offset, flexo, CD/DVD and 3-D screen environments, the system produces...
UV Process Supply Inc.
Request info >
FIBER OPTIC TEST
May 1, 2000 — The FOS 79800C/315SB and FOS 79800C/315SL high-power WDM distributed feedback modules have been unveiled by ILX Lightwave Corp. They deliver at least 20 mW of stable laser power at any specified wavelength from 1528 to 1610 nm. The devices offer...
Newport - ILX Lightwave, Photonics
Request info >
LASER MEASUREMENT
May 1, 2000 — The LK series charge-coupled device laser displacement meter has been developed for surface profiling and for measurement of thickness, height, position and size of metals and other materials. Available from Keyence Corp. of America, the instrument...
Keyence Corp.
Request info >
LASER POWER METER
May 1, 2000 — Ophir Optronics Inc. has introduced a laser power meter that supports more than 50 thermal heads in the microwatt to 20-kW range. The Orion/TH's 32 x 122-pixel graphics on a Supertwist LCD with electroluminescent backlight and Soft Keys guide users...
MKS Ophir, Light & Measurement
Request info >
DIODE LASER
Apr 1, 2000 — The Tec 500 Littman laser is suitable for molecular spectroscopy, metrology, injection seeding, and atom cooling and trapping. Sacher Lasertechnik designed the tunable, external cavity diode laser to synchronize the grating- and cavity-defined...
Sacher Lasertechnik GmbH
Request info >
MULTIWAVELENGTH METER
Apr 1, 2000 — With a wavelength accuracy of ±0.003 nm, the FTB-5320 multiwavelength meter measures wavelength and power variation in the C- and L-bands and provides a real-time graphical representation of wavelength drift. Exfo Electro-Optical Engineering...
EXFO Inc.
Request info >
SPECTROPHOTOMETERS
Apr 1, 2000 — Secomam has released Prim Light and Prim Advanced UV-VIS spectrophotometers for laboratory applications. The Prim Light offers a range of 330 to 900 nm for a 10-nm bandwidth, making it suitable for routine measurements. The Advanced model is...
Secomam
Request info >
LASER ERROR MAPPING
Mar 1, 2000 — The 6-D HP laser measuring system from Automated Precision Inc. simultaneously maps six possible positioning errors of a coordinate measurement machine and other metrology instruments. The system error-maps linear displacement in the direction of...
Automated Precision Inc. (API)
Request info >
POSITION MEASUREMENT
Mar 1, 2000 — The LPM series of laser position monitors from Laser Components GmbH determines the position of an object perpendicular to the laser beam with a possible resolution of 1 µm. The transmitter and receiver are separate units that may be arranged...
Laser Components Germany GmbH
Request info >
LARGE-AREA NONCONTACT SURFACE MEASUREMENT
Feb 1, 2000 — The OSP500LM noncontact surface profiling, measurement and gauging instrument from Uniscan Instruments Ltd. is designed for high-speed metrology applications where surface measurement at the micron level is required over areas up to 500 x 500 mm....
Uniscan Instruments Ltd.
Request info >
INTERFEROMETER FOR FTIR SPECTROSCOPY
Jan 1, 2000 — PLX Inc. has developed an interferometer for FTIR spectroscopy. The single monolithic structure contains two mirrors and a beamsplitter fused with top and bottom glass plates of the same material. The uniform coefficient of thermal expansion of the...
PLX Inc.
Request info >
MINI OPTICAL TIME-DOMAIN REFLECTOMETERS
Jan 1, 2000 — The MW9076 family of miniature optical time-domain reflectometers (OTDR) from Anritsu Co. display measurement results in 10 s and have a sampling speed of 0.15 s. The dynamic range of the four models in this family range from 34 to 45 dB. The...
Anritsu Co.
Request info >
<
1
2
3
...
113
114
115
116
117
118
>
(2,933 results found)
July 2024
Subscribe
Advertise
Issue Library
Latest News
Optimax Launches Dedicated Space Systems Business
Jul 30, 2024
ANELLO Photonics Partners with BEAMAGINE
Jul 30, 2024
Singlet Fission Can Boost Power of Si-Based Solar
Jul 30, 2024
Cepton to be Acquired by Koito
Jul 29, 2024
IEEE Photonics Society Names Award Recipients
Jul 29, 2024
Cellphone-Based Raman Spectrometer Recognizes Materials in Minutes
Jul 29, 2024
U.K. Government Decision Clears Way for Exosens to Acquire Centronic Limited
Jul 29, 2024
Nearfield Instruments Secures €135M Funding Round: Week in Brief: 7/26/24
Jul 26, 2024
PsiQuantum to Build Utility-Scale Quantum Computer in Chicago
Jul 26, 2024
Stacked Vertical MoS2 Layers Show Strong Optoelectrical Qualities
Jul 25, 2024
Features
Femtosecond Lasers Spur a Precision Revolution in Materials Processing
Photonics Spectra
, Jul 2024
In the All-Data Revolution, Optical Solutions Advance Beyond PICs
Photonics Spectra
, Jul 2024
Ultraviolet PICs Push the Potential of Nonvisible Microscopy
Photonics Spectra
, Jul 2024
Explore Our Content
News
Features
Latest Products
Webinars
White Papers
All Things Photonics Podcast
Videos
Our Summits & Conferences
Industry Events
Bookstore
Join Our Community
Subscribe
Advertise
Become a member
Sign in
Contribute a Feature
Suggest a Webinar
Submit a Press Release
Mobile Apps
About Us
Our Company
Our Publications
Contact Us
Career Opportunities
Teddi C. Laurin Scholarship
Terms & Conditions
Privacy Policy
California Consumer Privacy Act (CCPA)
©2024 Photonics Media
100 West St.
Pittsfield, MA, 01201 USA
[email protected]
We use cookies to improve user experience and analyze our website traffic as stated in our
Privacy Policy
. By using this website, you agree to the use of
cookies
unless you have disabled them.