Wavelength Test Station
McPHERSONRequest Info
CHELMSFORD, Mass., Nov 20, 2015 — 
The STS spectral test station from McPherson Inc. is designed for wavelength testing and calibration from the longwave-infrared to 200 nm and less.
Discrete, high-purity wavelength bands are delivered to devices under test, helping characterize the response of sensors. The STS enables spectral test and characterization of diverse sensor and seeker formats including high-tech imaging and hyperspectral and electro-optical tracking sensors.
A research-grade, short-wavelength spectrometer is used to accommodate vacuum and extreme-ultraviolet applications. Sensor testing, process control and ground-based calibration of flight sensors are possible.
https://www.mcphersoninc.com
/Buyers_Guide/McPHERSON/c9188
Published: November 2015
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to McPHERSON by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required