Ion Beam Microscopes
Carl Zeiss Microscopy LLCRequest Info
THORNWOOD, N.Y., Aug. 29, 2019 — 
The Crossbeam 350 and Crossbeam 550 ion beam microscopes from Carl Zeiss Microscopy LLC cover advancements in analytics, tomography, sample preparation, and data integrity.
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) detection is included, with an added SIMS solution for elemental analysis. Enhanced workflows for 3D tomography ensure 3D data volume generation. Quantified and calibrated measurement of z-slice thickness allows for proper reconstruction of tomogram slices into a reconstructed volume. An update of the ZEISS Atlas 5 hardware and software package improves 3D analysis, correlative workflows and definition of slice thickness.
Applications include engineering materials, energy materials, soft materials, and geosciences covering megatrends in additive manufacturing, battery and photovoltaic research, building materials, and nanomaterials.
http://www.zeiss.com/microscopy
/Buyers_Guide/Carl_Zeiss_Microscopy_LLC/c16324
Published: August 2019
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