InSight WLI with 300-mm Handler
Bruker Nano SurfacesRequest Info
The fully automated InSight WLI
system offers unmatched optical
surface measurement capabilities
with wafer-handler integration.
Designed from the ground up for
the most demanding R&D, quality
assurance, and process quality control
needs, the InSight WLI incorporates
Bruker’s patented tip/tilt head, a
proprietary self-calibrating laser
reference, integrated pattern recognition, and a host of other
Bruker-exclusive interferometry innovations.
https://www.bruker.com/nano
/Buyers_Guide/Bruker_Nano_Surfaces/c19385
Published: August 2021
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