Freeform Optic Characterization
Hinds Instruments Inc.Request Info
SPIE Optics + Photonics 2018 Booth: 322
Freeform or non-planar optics often have alignment altering residual stress. Hinds’ next generation birefringence imaging system makes quantifiable results of stress available in seconds. The Midfield Imager’s software package supplies a retardance image with sub-millimeter spatial resolution and corresponding data with measurement resolution below 5 nm. Stop by our booth at Optics & Photonics to test the system.
https://www.hindsinstruments.com/products/birefringence-measurement-systems/
/Buyers_Guide/Hinds_Instruments_Inc/c6111
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