Dynamic Profiler
4D Technology CorporationRequest Info
For 3-D measurement of surface roughness on large polished optics
and optical-quality surfaces, despite vibration or turbulence, 4D Technology Corp.
has released the NanoCam Sq dynamic profiler. The instrument replaces the slow,
messy replication methods required by traditional workstation interferometers. By
enabling on-machine roughness metrology, it reduces handling and transportation
of the optic, increasing throughput and reducing the risk of damage to expensive,
mission-critical optics. It uses dynamic interferometry, incorporating a high-speed
optical sensor that measures thousands of times faster than typical profilers, according
to the company. Because acquisition time is short, the NanoCam Sq can measure despite
vibration, making it possible to mount the instrument in polishing equipment, on
gantries or on robots. The system includes the profiler, computer system and 4Sight
analysis software.
https://www.4dtechnology.com
/Buyers_Guide/4D_Technology_Corporation/c5148
Published: May 2011
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