ContourX-500 Profilometer
Bruker Nano SurfacesRequest Info
As the world’s most comprehensive automated
benchtop system for fast, noncontact
3D surface metrology, the gage-capable
ContourX-500 boasts unmatched Z-axis
resolution and accuracy. This white-light
interferometry (WLI) profiler is easily customized
for the widest range of complex
applications, from QA/QC metrology of
precision machined surfaces and semiconductor
processes to R&D characterization
for ophthalmic and MEMS devices.
www.bruker.com/contourx
/Buyers_Guide/Bruker_Nano_Surfaces/c19385
Published: May 2021
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