Benchtop Stylus Profilometer
Bruker Nano SurfacesRequest Info
SAN JOSE, Calif., Sept. 23, 2024 — 
The Dektak Pro from Bruker is a benchtop stylus profilometer for microelectronics, semiconductor, display, solar, medical, and materials science applications. The benchtop system provides an expanded measurement area up to 200 mm of full-sample access for semiconductor applications, as well as a shortened time to results with improved measurement accuracy. The Dektak Pro includes an automatic step detection routine that requires less user-defined parameters, customizable 2D stress measurement analysis, and automatic centering and wafer mapping features.
https://www.bruker.com/nano
/Buyers_Guide/Bruker_Nano_Surfaces/c19385
Published: September 2024
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