Atomic Resolution Electron Microscope
JEOL USA Inc.Request Info
TOKYO, April 2, 2020 — 
The JEM-ARM300F2 GRAND ARM2 atomic resolution electron microscope from JEOL Ltd. is an analytical device that provides high resolution and analysis with a high degree of accuracy.
The transmission electron microscope features the FHP2 pole-piece to achieve an optimal combination of atomic resolution imaging along with large, solid-angle energy dispersive x-ray spectroscopy elemental analysis. Guaranteed STEM resolution is 53 pm at 300 kV and 96 pm at 80 kV. The standard configuration of the microscope includes an enclosure that mitigates external disturbances.
https://www.jeolusa.com
/Buyers_Guide/JEOL_USA_Inc/c7365
Published: April 2020
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to JEOL USA Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required