3XB Scan Head
FARO Technologies Inc., PhotonicsRequest Info
Dual-Wavelength Large-Field Scan Head
WINDHAM, N.H., Aug. 17, 2009 – Nutfield Technology Inc. has announced the 3XB dual-wavelength large-field three-axis scan head that offers smaller spot sizes and larger scan fields than can be achieved with f-Theta lenses.
Dual-wavelength technology allows systems designers and those working in R&D to employ a single scan head for use with both 532- and 1064-nm lasers, providing an economic advantage by reducing scan head inventories for situations where both wavelengths are used. 
The scan heads offer small spot diameters and large scan fields. At 532 nm, the spot diameter is 7µm with a 150 × 150-mm field, and 19 µm at 500 × 500 mm. At 1064 nm, the spot diameter at 150 × 150 mm is 14 µm, and at 500 × 500 mm, it is 38 µm.
Scan field and spot size can be adjusted by simply turning a knob to vary the spacing between the translator and the objective lens, allowing system designers to experiment with and dial in the optimum field/spot size combination for their applications. The lens translator houses an expander lens that accepts a beam from the laser source. The beam expands and travels through an objective lens that lies in front of the X-Y scan mirrors in a “post objective scanning” configuration. The expander lens moves linearly along the axis of the beam to correct for focus in real time as a function of an X-Y position within the scan field.
The scan heads are available in 10-, 15-, 20-, 30- and 45-mm apertures. They are available for fiber lasers and in open kit form. The integrated design leverages proprietary galvo technology to offer high bandwidth, accuracy and flexibility in three-axis technology.
Applications include scribing, edge deletion, grooving, cutting, marking and engraving.
For more information, visit: www.nutfieldtech.com
Nutfield Technology Inc.
49 Range Road
Windham, N.H. 03087
Phone: (603) 893-6200
Fax: (603) 893-6214
https://www.faro.com/en
/Buyers_Guide/FARO_Technologies_Inc_Photonics/c10555
Published: August 2009
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