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Microscopy
Microscope Systems
Other Microscopy Products
Key Suppliers
Prior Scientific Inc.
Thorlabs Inc.
Siskiyou Corporation
Andor Technology
Bruker Nano Surfaces
Applied Scientific Instrumentation Inc.
Edmund Optics
CoolLED Ltd.
Zygo Corporation
Photon etc.
DRS Daylight Solutions Inc.
Apre Instruments
Sutter Instrument Company
28 products
Microscopy
Clear All Filters x
surface x
Microscopy x
S-Series Interferometer
Apre Instruments
Category:
Microscopy / Other Microscopy Products
Type:
Other
Distortion:
<0.1%
Fringe Resolution:
650 fringe/aperture
Image Resolution (100 mm):
100 µm
SpectrÄ: Spectrally Controlled Interferometry
Apre Instruments
Category:
Microscopy / Other Microscopy Products
Type:
Other
NewView 3D Optical Profiler
Zygo Corporation
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
Compass™ 2
Zygo Corporation
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
ZeGage™ Pro
Zygo Corporation
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
Nexview™ NX2 3D Optical Profiler
Zygo Corporation
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
Contour Elite I
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Optical
Magnification:
115X
Max Scan:
73 μm / sec
Max Scan Range:
≤10mm
Sample Height:
Up to 100 mm (4 in.)
NPFLEX
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Optical
Magnification:
115X
Optical Resolution:
0.33 µm
RMS Reapeatability:
0.004 nm
Vertical Resolution:
<0.1 nm
Contour Elite K
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Optical
Magnification:
115X
Max Scan:
47 μm/sec
Max Scan Range:
>10 mm
Sample Height:
Up to 100 mm
MultiMode 8-HR
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Imaging Noise Level:
<30 pm rms
Maximum Sample Size:
15 mm dia × 5 mm thick
JPK NanoWizard AFMs
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Innova
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Closed-Loop, Large-Area Scanner:
XY >90 µm, Z >7.5 µm
Open-Loop, Small-Area Scanner:
XY >5 µm, Z >1.5 µm
Sample Size:
45 mm × 45 mm x 18 mm
Dimension FastScan Bio
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Sample Environment — Flow Cell:
60 μL
X-Y Tip-Velocity Max.:
>2 mm/s
Z Range:
≥3 μm
Dimension FastScan
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Integral Nonlinearity XYZ:
<0.50%
X-Y Scan Range:
90 μm × 90 μm typical
Z Range:
10 μm typical in imaging
Dimension Edge
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
X-Y Scan Range:
85 μm minimum
Z Range:
9.5 μm minimum
DektakXT
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Optical
Data Points Per Scan:
120,000 max.
Stylus Force:
1 to 15 mg with LIS 3 sensor
Vertical Range:
1 mm
Dektak XTL
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Optical
Stylus Force:
0.03 mg to 15 mg
Vertical Range:
1 mm
Vertical Resolution:
1Å max. (@6.55 µm range)
Ultima Multiphoton
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Scan Size:
64 x 64 to 2048 x 2048
Scanning Method:
Pair of 6mm galvanometers
Dimension Icon
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Integral nonlinearity XYZ:
<0.5% typical
X-Y scan range:
90 μm x 90 μm typical
Z range:
10 μm typical in imaging
MSA-600 Micro System Analyzer
Polytec Inc.
Category:
Microscopy / Other Microscopy Products
Type:
Other
S wide
Sensofar Metrology
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
Display Resolution:
0.001 µm
Max. Extended Measuring area:
300 × 300 mm
Vertical Measuring Range:
40 mm
S neox Five Axis
Sensofar Metrology
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
S neox
Sensofar Metrology
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
S mart
Sensofar Metrology
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
TopMap Micro.View+ 3D Optical Profiler
Polytec Inc.
Category:
Microscopy / Other Microscopy Products
Type:
Other
TopMap In.Line 3D Optical Profiler
Polytec Inc.
Category:
Microscopy / Other Microscopy Products
Type:
Other
TopMap Micro.View 3D Optical Profiler
Polytec Inc.
Category:
Microscopy / Other Microscopy Products
Type:
Other
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Microscopy Products
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