Register
Sign In
Suppliers
Products
Categories
Handbook
Dictionary
Careers
Resources
Photonics Spectra
BioPhotonics
Vision Spectra
Virtual Events & Summits
Educational Institutions
Add/Update Your Listing
Exhibitor Listing Portal
Become an Exhibitor
Buyers' Guide Print Edition
Marketplace Help
Subscribe
Advertise
Suppliers
Products
Categories
Handbook
Dictionary
Careers
Resources
Photonics Spectra
BioPhotonics
Vision Spectra
Virtual Events & Summits
Educational Institutions
Add/Update Your Listing
Exhibitor Listing Portal
Become an Exhibitor
Buyers' Guide Print Edition
Marketplace Help
Register
Sign In
Photonics Marketplace
Suppliers
Products
Handbook
Institutions
Dictionary
Show Filters
Hide Filters
Products by Category
< All Categories
Microscopy
Microscope Systems
Other Microscopy Products
Key Suppliers
Prior Scientific Inc.
Thorlabs Inc.
Siskiyou Corporation
Andor Technology
Bruker Nano Surfaces
Applied Scientific Instrumentation Inc.
Edmund Optics
CoolLED Ltd.
Zygo Corporation
Photon etc.
DRS Daylight Solutions Inc.
Apre Instruments
Sutter Instrument Company
13 products
Microscopy
Clear All Filters x
metro x
Microscopy x
S-Series Interferometer
Apre Instruments
Category:
Microscopy / Other Microscopy Products
Type:
Other
Distortion:
<0.1%
Fringe Resolution:
650 fringe/aperture
Image Resolution (100 mm):
100 µm
SpectrÄ: Spectrally Controlled Interferometry
Apre Instruments
Category:
Microscopy / Other Microscopy Products
Type:
Other
Contour Elite I
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Optical
Magnification:
115X
Max Scan:
73 μm / sec
Max Scan Range:
≤10mm
Sample Height:
Up to 100 mm (4 in.)
Dektak XTL
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Optical
Stylus Force:
0.03 mg to 15 mg
Vertical Range:
1 mm
Vertical Resolution:
1Å max. (@6.55 µm range)
Contour Elite K
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Optical
Magnification:
115X
Max Scan:
47 μm/sec
Max Scan Range:
>10 mm
Sample Height:
Up to 100 mm
TopMap Micro.View+ 3D Optical Profiler
Polytec Inc.
Category:
Microscopy / Other Microscopy Products
Type:
Other
TopMap In.Line 3D Optical Profiler
Polytec Inc.
Category:
Microscopy / Other Microscopy Products
Type:
Other
TopMap Micro.View 3D Optical Profiler
Polytec Inc.
Category:
Microscopy / Other Microscopy Products
Type:
Other
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
S wide
Sensofar Metrology
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
Display Resolution:
0.001 µm
Max. Extended Measuring area:
300 × 300 mm
Vertical Measuring Range:
40 mm
S neox Five Axis
Sensofar Metrology
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
S neox
Sensofar Metrology
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
S mart
Sensofar Metrology
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
Microscopy Products
Need Help?
Explore Our Content
News
Features
Latest Products
Webinars
White Papers
All Things Photonics Podcast
Videos
Our Summits & Conferences
Industry Events
Bookstore
Join Our Community
Subscribe
Advertise
Become a member
Sign in
Contribute a Feature
Suggest a Webinar
Submit a Press Release
Mobile Apps
About Us
Our Company
Our Publications
Contact Us
Career Opportunities
Teddi C. Laurin Scholarship
Terms & Conditions
Privacy Policy
California Consumer Privacy Act (CCPA)
©2024 Photonics Media
100 West St.
Pittsfield, MA, 01201 USA
[email protected]
We use cookies to improve user experience and analyze our website traffic as stated in our
Privacy Policy
. By using this website, you agree to the use of
cookies
unless you have disabled them.