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Microscope Systems
Optical
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Optical
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X
Spectral Range
Optical
FIR
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VIS
XRAY
Resolution
Electron/Scanning Probe
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pm
nm
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Key Suppliers
Andor Technology
Bruker Nano Surfaces
Applied Scientific Instrumentation Inc.
Zygo Corporation
Photon etc.
DRS Daylight Solutions Inc.
Sutter Instrument Company
17 products
Microscope Systems
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3-D imaging x
Microscopy x
Microscope Systems x
Light Sheet for Cleared Tissue
Applied Scientific Instrumentation Inc.
Type:
Optical
Spectral Range:
VIS
Image acquisition:
10^8 voxels/s
Media RI range:
1.33-1.56
Resolution in XYZ:
sub-micron
Single-Objective Light Sheet
Applied Scientific Instrumentation Inc.
Type:
Optical
Magnification:
67X
Spectral Range:
VIS
Field of view:
≤350µm
Measured resolution in X:
≅450nm
Measured resolution in Y:
≅350nm
BC43 WF
Andor Technology
Type:
Optical
BC43 SR
Andor Technology
Type:
Optical
BC43 CF
Andor Technology
Type:
Optical
Core Imaging Modes:
Widefield epifluorescence. Transmitted light - brightfield and differential phase contrast
Imaging Methods:
Single color, multicolor, z-stacking (volume), time-lapse, multi-position, multi-well, montage and 2/3D stitching
Imaging Modes:
3
IMA™ - Hyperspectral Microscope
Photon etc.
Type:
Optical
Spectral Range:
VIS,NIR,SWIR
Camera:
CCD, EMCCD, InGaAs
Darkfield Module:
Oil, Dry
Excitation Wavelengths:
405, 532, 730, 785, 808
IR VIVO
Photon etc.
Type:
Optical
Spectral Range:
VIS,NIR,SWIR
Emission Spectral Range:
500 - 1620 nm
Field of view:
up to 3 mice
Filter Types:
multi- or hyperspectral
Contour Elite I
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Max Scan:
73 μm / sec
Max Scan Range:
≤10mm
Sample Height:
Up to 100 mm (4 in.)
Spero® QCL-IR Microscope
DRS Daylight Solutions Inc.
Type:
Optical
Spectral Range:
MWIR
Image Acquisition Time:
< 40 s for image cube
Imaging Modes:
Transmission and Reflection
Spectral Resolution:
Variable, down to 2 cm-1
MultiMode 8-HR
Bruker Nano Surfaces
Type:
Scanning Probe
Imaging Noise Level:
<30 pm rms
Maximum Sample Size:
15 mm dia × 5 mm thick
Contour Elite K
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Max Scan:
47 μm/sec
Max Scan Range:
>10 mm
Sample Height:
Up to 100 mm
Tungsten Filament Scanning Electron Microscope SEM3200
CIQTEK Co. Ltd.
Type:
Electron
Acceleration Voltage:
0.2-30 kV
Extension:
SE\BSE\EDS\EDX\EBSD, etc.
Low Vacuum Mode:
3 nm @ 30 kV (SE)
FESEM Field Emission Scanning Electron Microscope SEM5000Pro
CIQTEK Co. Ltd.
Type:
Electron
Acceleration Voltage:
0.02 ~ 30 kV
Electron Gun:
High-brightness Schottky
Magnification:
1 ~ 2,500,000 ×
14793-TS2 - Inspex 3 on Illuminated Track Stand
UNITRON Ltd.
Type:
Optical
Magnification:
131.6X
Spectral Range:
VIS
Camera Resolution:
1080p, 1980 × 1080, 60fps
Connectivity:
PC
Illumination:
Integrated LED ring light
EXI-600M
ACCU-SCOPE Inc.
Type:
Optical
Magnification:
100X
Camera Ports:
3 ports: left, right, top
Condenser:
6-position turret
Display:
LCD screen display
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
Type:
Scanning Probe
Model 4200M
Hinalea Imaging
Type:
Optical
Spectral Range:
VIS,NIR
Number of Spectral Bands:
300 nominal, 600 maximum
Sensor Spatial Resolution:
2.3
Spectral Range:
4-0 - 1,000 nm
Microscope Systems Products
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