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Struers to Sell Phenom-World SEMs in Nordic Region

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EINDHOVEN, The Netherlands, June 24, 2010 — Struers A/S and Phenom-World BV announced today the start of a partnership making Struers the exclusive distributor for the Phenom Desktop scanning electron microscope (SEM) in Denmark, Finland, Norway and Sweden. The semi-automatic and automatic sample preparation equipment and consumables provider has used Phenom-World products within its company, providing the base for the partnership. The automated desktop SEM can achieve 24,000X magnification, superior image quality, and is user-friendly. It complements the Struers product portfolio within materialography, providing a...Read full article

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    Published: June 2010
    Glossary
    electron beam
    A stream of electrons emitted by a single source that move in the same direction and at the same speed.
    image quality
    A measure of the closeness with which an optical image is capable of resembling the original object. The factors that affect image quality are lens aberrations, diffraction, dirt and stray light within the system, and atmospheric turbulence and haze outside it. If the image is recorded photographically, it can become further degraded by image motion during exposure and by light diffusion in the emulsion. At one time image quality was expressed by its resolving power, but today a more meaningful...
    magnification
    The ratio of the size of the image of an object to that of the object. The ratio of the linear size of the image to that of the object is lateral magnification. Angular magnification is the ratio of the apparent angular size of the image observed through an optical device to that of the object viewed by the unaided eye. Longitudinal magnification is the ratio of the longitudinal or axial dimension of an image to the corresponding dimension of the object.
    microscope
    An instrument consisting essentially of a tube 160 mm long, with an objective lens at the distant end and an eyepiece at the near end. The objective forms a real aerial image of the object in the focal plane of the eyepiece where it is observed by the eye. The overall magnifying power is equal to the linear magnification of the objective multiplied by the magnifying power of the eyepiece. The eyepiece can be replaced by a film to photograph the primary image, or a positive or negative relay...
    scanning electron microscope
    A scanning electron microscope (SEM) is a powerful imaging instrument used in scientific research, materials characterization, and various industrial applications. Unlike traditional optical microscopes, which use visible light to magnify and image specimens, SEMs use a focused beam of electrons to generate high-resolution images of a sample's surface. scanning electron microscope suppliers → The basic principle of operation involves focusing a beam of electrons onto the...
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