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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

Strong Standards Needed for Metrology and Raman Analysis

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Li-Lin Tay, Metrology Research Centre, National Research Council Canada

Raman analysis faces several obstacles in meeting objective regulatory requirements — such as the lack of traceable quantification methods and absence of certified reference materials — which prevents its widespread use. Raman spectroscopy does not have an underlying metrological infrastructure, such as standardization allowing measurements to be linked to a quantity in the International System of Units (SI). A recent survey, conducted by the Versailles Project on Advanced Materials and Standards (VAMAS) Technical Working Area 42 on Raman Spectroscopy and Microscopy, has...Read full article

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    Published: March 2024
    Glossary
    si
    Systeme Internationale d'Unites, the international metric system of units.
    International System of UnitsSiSRSTERSVAMASAmerican Society for Testing and MaterialsASTMMetrology Research CentreBioOpinion

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