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Method Measures Electron Dynamics in Semiconductor Materials

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JOEL WILLIAMS, ASSOCIATE EDITOR
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JAKE SALTZMAN, NEWS EDITOR
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The properties and performance of semiconductor chips powering modern technologies are ultimately determined by free electrons. With the continued miniaturization of electronic and photonic devices, tools to examine the behavior of free electrons, simultaneously at the picosecond-time and nanometer-length scales, have become necessary. A method developed by researchers at the University of California, Berkeley is poised to allow more effective measurement of these electrons, opening paths to better energy efficiency. The researchers developed what they described as a new type of optical...Read full article

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    Published: March 2023
    Glossary
    infrared
    Infrared (IR) refers to the region of the electromagnetic spectrum with wavelengths longer than those of visible light, but shorter than those of microwaves. The infrared spectrum spans wavelengths roughly between 700 nanometers (nm) and 1 millimeter (mm). It is divided into three main subcategories: Near-infrared (NIR): Wavelengths from approximately 700 nm to 1.4 micrometers (µm). Near-infrared light is often used in telecommunications, as well as in various imaging and sensing...
    Research & TechnologyLasersMicroscopyImagingsemiconductorsMaterialsinfraredelectron dynamicsfree electronsUC BerkeleyUniversity of California BerkeleyBerkeley EngineeringAmericasTechnology News

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