Keithley Instruments Inc., an advanced electrical test instruments and systems provider, announced it will broadcast a free, web-based seminar titled, “Fundamentals of Ultrafast I-V Device Characterization,” on April 29, 2010. The one-hour presentation will examine the importance of ultrafast current-voltage (I-V) characterization across a broad spectrum of device and process technologies. Common applications include non-volatile memory devices (NVM), like Flash and phase change memory, isothermal characterization on silicon-on-insulator (SOI) devices and compound semiconductors, and transient characteristics of new materials, such as high-K dielectrics. A core description of the measurement hardware and setups, including cabling to a probe station, will be covered during the seminar. It will also address typical test setups and common error sources. Lastly, it will define some practical examples of device measurements. There will be an opportunity for participants to ask questions at the event. It is recommended for students, researchers and engineers who work in the characterization of materials, processes and devices; lab managers who want to learn about the measurement technique; and engineers who perform device and material reliability studies. It will be presented by Lee Stauffer, a senior staff technologist for the company’s Semiconductor Measurement Group. He has previously worked designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs. For more information, visit: www.keithley.com