Benchtop Stylus Profilometer
Bruker Nano SurfacesRequest Info
SAN JOSE, Calif., Sept. 23, 2024 — The Dektak Pro from Bruker is a benchtop stylus profilometer for microelectronics, semiconductor, display, solar, medical, and materials science applications. The benchtop system provides an expanded measurement area up to 200 mm of full-sample access for semiconductor applications, as well as a shortened time to results with improved measurement accuracy. The Dektak Pro includes an automatic step detection routine that requires less user-defined parameters, customizable 2D stress measurement analysis, and automatic centering and wafer mapping features.
https://www.bruker.com/nano
/Buyers_Guide/Bruker_Nano_Surfaces/c19385
Published: September 2024
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to Bruker Nano Surfaces by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required