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Excelitas PCO GmbH - PCO.Edge 11-24 BIO LB

Bruker AXS Buying AFM Maker

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KARLSRUHE, Germany, Aug. 18, 2008 -- Analytical x-ray systems manufacturer Bruker AXS GmbH of Karlsruhe, Germany, announced it will acquire the German company SIS (Surface Imaging Systems) GmbH, a maker of advanced atomic force/scanning probe microscopy (AFM/SPM) systems, for an undisclosed amount. AFM/SPM is used for ultrahigh spatial resolution surface imaging and the characterization of surfaces down to atomic dimensions. SIS, which is located in Herzogenrath, near Aachen, has annual revenues of about $3 million, Bruker said. Its systems are used for applications in materials research including semiconductors, data...Read full article

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    Published: August 2008
    Glossary
    nano
    An SI prefix meaning one billionth (10-9). Nano can also be used to indicate the study of atoms, molecules and other structures and particles on the nanometer scale. Nano-optics (also referred to as nanophotonics), for example, is the study of how light and light-matter interactions behave on the nanometer scale. See nanophotonics.
    photonics
    The technology of generating and harnessing light and other forms of radiant energy whose quantum unit is the photon. The science includes light emission, transmission, deflection, amplification and detection by optical components and instruments, lasers and other light sources, fiber optics, electro-optical instrumentation, related hardware and electronics, and sophisticated systems. The range of applications of photonics extends from energy generation to detection to communications and...
    x-ray diffraction
    The bending of x-rays by the regular layers of molecules in a crystal acting like a very small diffraction grating. The diffraction pattern so obtained and recorded on film provides a means for analyzing the crystal structure.
    AFMAFM/SPMatomic forceBasic ScienceBiophotonicsBruker AXSBruker Nanocharacterizationdate storageelectronicEmploymentenergyFussHerzogenrathImagingMicroscopynanoNews & FeaturesphotonicspolymersSaurenbachscanning probesemiconductorsSISsolarSPMSurface Imaging Systemsx-ray diffractionXRD

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