LEXINGTON, Mass., July 13 -- Photoelectron Corp. has received an order from a third OEM for 100 miniature x-ray systems for x-ray fluorescence measurements (Laser-x). The first prototype of this new technology was produced in October 2000 and orders have been previously received from two additional OEM's in the fourth quarter of 2000.
    The system is a nonmedical miniature x-ray source for x-ray fluorescence analysis, a method of measuring the atomic composition of a material. It is designed to be incorporated into equipment used for nondestructive materials testing and to replace the radioactive sources that are currently used to provide radiation for fluorescence analysis. This procedure can be used in a variety of applications, including environmental monitoring, testing for lead in paints, analysis of alloys and geological samples, testing of paints and pigments in works of art, and identification of the atomic composition of artifacts.