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Excelitas PCO GmbH - PCO.Edge 11-24 BIO LB

Leica MS Buys Bal-Tec

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BANNOCKBURN, Ill., May 28, 2008 -- Leica Microsystems Inc. announced it has acquired Liechtenstein, Germany-based Bal-Tec AG, a maker of mechanical and cryo sample preparation equipment for scanning electron microscopy and transmission electron microscopy (TEM). Terms were not disclosed.

Bal-Tec becomes part of Leica Microsystems, which makes biological sample preparation instruments for electron microscopy and other products for applications requiring microscopic imaging, measurement and analysis.

Leica Microsystems recently entered the SEM and solid-state sample preparation market with the launch of the EM TXP target preparation instrument. Bal-Tec products such as the EM VCT100 vacuum cryo transfer system for SEM, which provides sample transfer from preparation equipment to analysis systems for electron microscopy, and the EM HPM100 high-pressure freezing unit are now available from Leica Microsystems.

For more information, visit: www.leica-microsystems.com
Zurich Instruments AG - Challenge Us 10/24 MR

Published: May 2008
Glossary
photonics
The technology of generating and harnessing light and other forms of radiant energy whose quantum unit is the photon. The science includes light emission, transmission, deflection, amplification and detection by optical components and instruments, lasers and other light sources, fiber optics, electro-optical instrumentation, related hardware and electronics, and sophisticated systems. The range of applications of photonics extends from energy generation to detection to communications and...
scanning electron microscopy
Scanning electron microscopy (SEM) is an advanced imaging technique used in microscopy to obtain high-resolution, three-dimensional images of the surfaces of solid specimens. SEM achieves this by using a focused beam of electrons to scan the specimen's surface, resulting in detailed images with magnifications ranging from about 10x to 100,000x or higher. Key features and principles of scanning electron microscopy include: Electron beam: SEM uses an electron beam instead of visible light for...
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