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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

Next Generation Echelle Spectrometer for Optical Emission Spectroscopy

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Author: M. Sandtke and A. Maas, SPECTRAL Industries
Tuesday, February 19, 2019
Flash Photonics Inc., Distribution and Optical Sensing

The SPECTRAL Industries IRIS echelle spectrometer features a combination of large bandwidth and high spectral resolution. It is ideal for Optical Emission Spectroscopy (OES), astronomy, and time-resolved fluorescence. Its gating below 100 ns is possible with a patented feedback loop scheme in combination with sophisticated software algorithms. IRIS offers high optical throughput, combined with a low noise detector resulting in an unmatched signal-to-noise ratio. It was designed for use in space and so is robust. It is also an affordable option.

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File: 20190218_flash_photonics_spectral_industries_iris_app_note.pdf (830.01 KB)
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echelle spectrometerlaser-induced breakdown spectroscopyLIBSRaman spectroscopyoptical emission spectroscopyOESIrisSPECTRAL IndustriesFlash PhotonicsspectroscopyTest & Measurement
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