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Opto Diode Corp. - Opto Diode 10-24 LB

Measurement of Film Stacks in Cell Phones and Tablets Using White Light Interferometry

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Author: Filipp Ignatovich, Michael Spaeth, John Solpietro, Winslow Cotton, Donald Gibson
Monday, July 20, 2015
Lumetrics

With the explosive growth of the tablet and smart phone market, equipment suppliers are developing more complex structures that include polarizers, LCDs, structured air gaps, and more. There are few systems that provide the measurement capabilities to examine all the layers, non-destructively. Lumetrics will provide examples of how its white light interferometer has easily provided these measurements. Lumetrics will provide results of testing on various samples of up to 10 – 20 layers.

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Test & MeasurementSensors & Detectorsfilm measurementLCD Measurementinterferometerswhite light interferometrynon-contact measurementnon-destructive measurementcell phone measurementthin glass measurementcoating measurementfilm quality controlglass quality controloptical measurementLumetrics
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