Zurich Instruments AG - Challenge Us 10/24 LB

view all white papers and application notes

Easy to use Computer Generated Holograms for Complex Surface Metrology

Author: Dr. Florian Hudelist
Tuesday, June 1, 2021
DIOPTIC GmbH

There are many metrology methods on the market for testing aspheres. The method with one of the highest known accuracies is based on a Fizeau interferometer, in combination with a CGH. We describe a so called DFNL type CGH, having the CGH diffractive structures integrated into the Fizeau reference surface, which provides a solution for measuring complex shapes that is comparable to the traditional methods used for testing spheres. Compared to a standard CGH, the DFNL simplifies the hardware and alignment steps required to measure a complex optical surface.

Download

Download White Paper

File: Whitepaper_DIOPTIC_DFNL.pdf (991.59 KB)
To download this white paper, please complete the *required fields before clicking the "Download" button.

Your contact information

* First Name:

* Last Name:

* Email Address:

* Company:

* Country:

When you click "Download", you agree that your personal contact information may be shared with DIOPTIC GmbH and they may contact you about their products and services in the future. You also agree that Photonics Media may contact you with information related to this request, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

* Required

Similar White Papers and Application Notes

A Novel Measurement System to Aid Polished Optical Surface Manufacturing When Working with Coated Surfaces

Topography becomes more important in quality assurance for manufacturing. This regards the characterization of macro-sized to medium optics and the optimization of a manufacturing process using a...

11/3/2020

- Polytec Inc.

Defining and Describing Surface Error

Controlling optical component performance requires well-defined measurement processes. Analysis software can help by guiding users through the steps of the measurement process (geometry fitting,...

11/18/2020

- Digital Metrology Solutions Inc.

Full-Field Hotspot Detection and High-Resolution Topographic Characterization of Post-CMP Wafers with 3D Optical Profiling

Traditional methods of post-CMP process evaluation have analytical limitations that, in light of tightening process control limits, do not meet the growing need for more accurate wafer surface...

8/1/2021

- Bruker Nano Surfaces

manufacturing equipment for photonic componentsoptical components & softwareTest & Measurementinspectionidentificationnondestructive testingquality controlinterferometrysurface metrologyCGHCGH Null Llensaspheresfreeform surfacesinterferometersDFNLreference opticstransmission spherescylinder lenseswavefront

Nov/Dec 2024 Subscribe Advertise
Issue Library

Opto Diode Corp. - PbS &PbSe Detectors 10-24 HP