view all white papers and application notes

Characterizing the temperature-induced evolution of the shape and texture of a silicon wafer

Friday, December 10, 2021
Sensofar Metrology

Using Linkam’s precision temperature control chamber with Sensofar’s Linnik objective lens eliminates these problems and allows accurate measurement of 3D topographic profiles of nanoscale materials. S neox 3D optical profiler with a Linnik objective has been shown to be the perfect complement to perform such experimental measurements. Moreover, different brightfield objectives are compatible with the Linnik configuration, offering working distances up to 37 mm and magnifications up to 100x for applications that require high lateral resolution.

Download

Download Application Note

File: 2021Linkam_Consumer_electronics3.pdf (2.35 MB)
To download this application note, please complete the *required fields before clicking the "Download" button.

Your contact information

* First Name:

* Last Name:

* Email Address:

* Company:

* Country:

When you click "Download", you agree that your personal contact information may be shared with Sensofar Metrology and they may contact you about their products and services in the future. You also agree that Photonics Media may contact you with information related to this request, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

* Required

Similar White Papers and Application Notes