PI Physik Instrumente - Mirorrs for Laser Comm LB LW 10/24

view all white papers and application notes

Atomic Force Microscopy Enhances the Nanoscopy Toolkit

Author: James F. MacKay
Friday, March 5, 2021
Mad City Labs Inc.

Imaging and morphology represent a critical puzzle piece when trying to understand nanoscale structures, whether they are naturally occurring, such as viruses, or engineered structures, such as nano-antennas and photonic devices. In addition to imaging, atomic force microscopy (AFM) is ideal for nanomechanical characterization, bringing utility to nanoscopy applications and excelling in conditions where low light presents challenges or sample integrity is vital.

Download

Download White Paper

File: AFM_enhances_the_nanoscopy_tookit.pdf (1.60 MB)
To download this white paper, please complete the *required fields before clicking the "Download" button.

Your contact information

* First Name:

* Last Name:

* Email Address:

* Company:

* Country:

When you click "Download", you agree that your personal contact information may be shared with Mad City Labs Inc. and they may contact you about their products and services in the future. You also agree that Photonics Media may contact you with information related to this request, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

* Required

Similar White Papers and Application Notes

Near-Field Scanning Optical Microscopes: Capabilities and Applications

NSOM techniques and instrumentation have evolved to become vital tools for material characterization, providing high-quality data and continually expanding utility, spot-on accuracy, adaptability,...

3/10/2021

- Mad City Labs Inc.

Precision Motion and How to Achieve It

Nanoscale motion requires fastidious attention to instrumentation, passive controls, and experiment design. Most users have experience in motion control within the sphere of the microscale. In this...

9/1/2022

- Mad City Labs Inc.

Understand Noise at the Sub-nanometer Level

Every positioner has some level of uncertainty in its position, some slight amount of movement that contributes noise to a measurement. The question is whether that uncertainty - also known as...

2/1/2023

- Mad City Labs Inc.

microscopes & accessoriespositioning/vibration-isolation equipmentTest & Measurementmaterials researchMicroscopyAFMSPMatomic force microscopescanning probeoptical microscopymetrologycorrelative microscopy

October 2024 Subscribe Advertise
Issue Library