Search
Menu
DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

Atomic Force Microscopy Enhances the Nanoscopy Toolkit

Facebook X LinkedIn Email
Author: James F. MacKay
Friday, March 5, 2021
Mad City Labs Inc.

Imaging and morphology represent a critical puzzle piece when trying to understand nanoscale structures, whether they are naturally occurring, such as viruses, or engineered structures, such as nano-antennas and photonic devices. In addition to imaging, atomic force microscopy (AFM) is ideal for nanomechanical characterization, bringing utility to nanoscopy applications and excelling in conditions where low light presents challenges or sample integrity is vital.

Download White Paper
File: AFM_enhances_the_nanoscopy_tookit.pdf (1.60 MB)
To download this white paper, please complete the *required fields before clicking the "Download" button.
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:




When you click "Download", you agree that your personal contact information may be shared with Mad City Labs Inc. and they may contact you about their products and services in the future. You also agree that Photonics Media may contact you with information related to this request, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required
microscopes & accessoriespositioning/vibration-isolation equipmentTest & Measurementmaterials researchMicroscopyAFMSPMatomic force microscopescanning probeoptical microscopymetrologycorrelative microscopy
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.