About This Webinar
The role of optical metrology in lens manufacturing can range from a quick quality check at the end of the line to offering critical feedback for deterministic processes. While many options for interferometer-based workstations are available to lens manufacturers, some configurations can offer significant time savings and reduce the time taken for every measurement. In this session, DeWitt explores various interferometer-based configurations and the pros and cons of each. Tradeoffs between flexibility and speed will be explored to assist with determining the optimal solution for various production environments and metrology applications.
***This presentation premiered during the 2021
Photonics Spectra Conference Optics track. For information on upcoming Photonics Media events,
see our event calendar here.
About the presenter:
Frank DeWitt has over 20 years of experience in the optics industry and is currently the general manager of XONOX Technology Inc. He has been with XONOX for three years, and in addition to directing the activities of the U.S. subsidiary, he has lead new product development. Previously, he was the director of engineering at Melles Griot in Rochester, N.Y.