About This Webinar
Whether in wafer production, electronic components, or PCB manufacturing camera-based inspection systems are used to ensure product quality. In order to meet the highest quality requirements, ever higher resolutions and speeds are required to detect defects at an early stage and thus reduce production costs.
Line scan cameras offer a scalable and cost-effective solution for such high resolution and speed requirements. For detecting different kinds of defects often two or more inspections with different light scenarios are required.
With line scan cameras, up to four images can be captured in one pass using multi-field imaging. Precise synchronization of cameras and light is required to obtain perfect images.
This presentation uses various examples to show how the high demands of semiconductor and electronics inspection can be met with line scan cameras and line lighting.
*** This presentation premiered during the
2024 Vision Spectra Conference. For more information on Photonics Media conferences and summits, visit
events.photonics.com
About the presenter
Maximilian Klammer, Ph.D., earned his doctorate at Technische Universität Darmstadt in 2017 while working at Chromasens GmbH as a project and team manager. After years with the company, he earned his current role as research and development director. His expertise combines team and product management, line scan experience, optical spectroscopy, and condensed matter physics.