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MoviTHERM Semiconductor Failure Analysis using Lockin Thermography



MoviTHERM's Semi-CHECK solutions allow the detection of shorts and other defects in semiconductors. This system uses a FLIR Thermal camera with microscopic lens attachment in order to provide the correct magnification. Lockin Thermography allows to detect defects with nano-watt to micro-watt signatures.

semiconductorSemiconductor Manufacturing International Corporationsemiconductor failure analysislockin thermographyFLIR camerathermal microscopynondestructive testingNDTNDEinfrared test equipmentinfrared imaging systemFlir Systems

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