MoviTHERM Semiconductor Failure Analysis using Lockin Thermography
MoviTHERM's Semi-CHECK solutions allow the detection of shorts and other defects in semiconductors. This system uses a FLIR Thermal camera with microscopic lens attachment in order to provide the correct magnification. Lockin Thermography allows to detect defects with nano-watt to micro-watt signatures.
semiconductorSemiconductor Manufacturing International Corporationsemiconductor failure analysislockin thermographyFLIR camerathermal microscopynondestructive testingNDTNDEinfrared test equipmentinfrared imaging systemFlir Systems