XPLOR 100 3D Inspection Station
M3 Measurement Solutions Inc.Request Info
SPIE Photonics West 2017 Booth: 5536
The XPLOR 100 is a fully automated metrology device designed for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands (works for most IR glasses).
This instrument enables full quality assurance and reports to guarantee your incoming and outgoing material meets specifications. XYZ resolution of +/- 1um. Sample size up to 100mm × 100mm × 100mm.
https://www.m3msi.com
/Buyers_Guide/M3_Measurement_Solutions_Inc/c9193
Published: January 2017
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