Search
Menu
Spectrogon US - Optical Filters 2024 LB
PROMOTED
CONTENT
Promoted content

XPLOR 100 3D Inspection Station

M3 Measurement Solutions Inc.Request Info
 
Facebook X LinkedIn Email
SPIE Photonics West 2016 Booth: 2815

XPLOR 100 3D Inspection StationThe XPLOR 100 is a fully automated metrology device designed for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands (works for most IR glasses).

This instrument enables full quality assurance and reports to guarantee your incoming and outgoing material meets specifications. XYZ resolution of +/- 1um. Sample size up to 100mm X 100mm X 100mm.



REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to M3 Measurement Solutions Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

metrologyProductsindustrySPIE Photonics West 2016

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.