Wafer Quality Measurement Tool
ACE Solution Co. Ltd.Request Info
ZHUBEI CITY, Taiwan, March 2, 2023 — The TZ6000 nondestructive wafer quality measurement tool from ACE Solution Co. Ltd. is incorporated with TeraView’s TeraPulse Lx technologies for use in the compound semiconductor industry.
The tool measures thickness, refractive index, resistivity, dielectric constant, surface and subsurface defects at selected positions, and whole wafer scanning map. Terahertz analysis meet the needs of the material inspection in imaging, spectroscopy, and semiconductor applications with a 3200-ps time-delay line. The system’s modular architecture and TeraView patented laser-gated photoconductive emitters and detectors provides flexibility and expandability.
https://www.acesolution.com.tw/en/index
/Buyers_Guide/ACE_Solution_Co_Ltd/c33458
Published: March 2023
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to ACE Solution Co. Ltd. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required