True Surface Microscopy
WITec GmbHRequest Info
WiTec GmbH has launched the True Surface Microscopy option for
topographic confocal Raman imaging applications. The core element of the imaging
mode is an integrated sensor for optical profilometry. Large-area topographic coordinates
from the profilometer measurement can be precisely correlated with the large-area
confocal Raman imaging data. This allows confocal Raman imaging along heavily inclined
or very rough samples, with the true surface held in constant focus, while high
confocality is maintained. With the new imaging mode, samples that previously required
extensive preparation to obtain a certain surface flatness now can be easily and
automatically characterized as they are. Complete system control and extensive data
evaluation are integrated within the WiTec Control and WiTec Project software environment,
guaranteeing ease of use.
https://raman.oxinst.com
/Buyers_Guide/WITec_GmbH/c16123
Published: February 2011
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